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1772 Results

  • BFM-Proxy Pair

    The BFM-Proxy Pair Pattern is an Environment Pattern to facilitate the design of transactors like drivers and monitors for dual domain partitioned testbenches that can be used for both simulation and emulation, and across verification engines (or platforms) in general.

  • Patterns Library

    The Verification Academy Patterns Library contains a collection of solutions to many of today's verification problems. The patterns contained in the library span across the entire domain of verification (i.e., from specification to methodology to implementation—and across multiple verification engines such as formal, simulation, and emulation).

  • Leveraging Verification IP (VIP) for Fast & Efficient Verification

    In this session you will learn how Verification IP (VIP) helps to overcome IP verification challenges.

  • UVM Framework – Create a UVM Environment in Less than an Hour

    In this session you will learn how the UVM Framework delivers reuse from block to chip to system in simulation and emulation and how to reduce your verification schedule by at least four weeks on every project.

  • Leveraging Verification IP (VIP) for Fast & Efficient Verification

    In this session you will learn how Verification IP (VIP) helps to overcome IP verification challenges.

  • UVM Framework – Create a UVM Environment in Less than an Hour

    In this session you will learn how the UVM Framework delivers reuse from block to chip to system in simulation and emulation and how to reduce your verification schedule by at least four weeks on every project.

  • Technical Paper: A New Stimulus Model for CPU Instruction Sets

  • UVM Forum - All Slides

  • UVM Forum Seminar - 2015: UVM Enabled Advanced Storage IP Silicon Success

  • UVM and Emulation - Easing the Path to Advanced Verification and Analysi

  • UVM Forum Seminar - 2015: Automating Scenario-Level UVM Tests with Portable Stimulus

  • UVM Forum Seminar - 2015: Improving UVM Testbench Debug Productivity and Visibility

  • Creating UVM Testbenches for Simulation & Emulation Platform Portability

    In this session, you will learn the fundamentals of hardware-assisted testbench acceleration.

  • UVM Forum Seminar - 2015: UVM Technology Overview

  • UVM Forum Seminar - 2015: UVM Everywhere: Industry Drivers, Best Practices, and Solutions

  • ISO 26262 Fault Analysis – Worst Case is Really the Worst

    Imagine you’re a verification engineer being asked to get a small 10K gate design ISO 26262 certified. Assuming you don’t take the smart decision to quit your job, what would be your first step? If you would have been asked to do plain functional verification of the design, it is obvious you would start by reading the DUT spec.

  • Memories Are Made Like This

    One of the most common requirements for the verification of a chip, board or system is to be able to model the behavior of memory components, and this is why memory models are one of the most prevalent types of Verification IP (VIP).

  • A New Stimulus Model for CPU Instruction Sets

    Verifying that a specific implementation of a processor is fully compliant with the specification is a difficult task. Due to the very large total stimuli space it is difficult, if not impossible, to ensure that every architectural and micro-architectural feature has been exercised. Typical approaches involve collecting large test-suites of real SW, as well as using program generators based on constrained- random generation of instruction streams, but there are drawbacks to each.

  • On-Chip Debug – Reducing Overall ASIC Development Schedule Risk

    With ASIC complexity on the increase and unrelenting time-to-market pressure, many silicon design teams still face serious schedule risk from unplanned spins and long post-silicon debug cycles. However, there are opportunities on both the pre-silicon and post-silicon sides that can be systematically improved using on-chip debug solutions.

  • Hardware Emulation: Three Decades of Evolution—Part III

    At the beginning of the third decade, circa 2005, system and chip engineers were developing evermore complex designs that mixed many interconnected blocks, embedded multicore processors, digital signal processors (DSPs) and a plethora of peripherals, supported by large memories. The combination of all of these components gave real meaning to the designation system on chip (SoC).

  • QVIP Provides Thoroughness in Verification

    The present day designs use standard interfaces for the connection and management of functional blocks in System on Chips (SoCs). These interface protocols are so complex that, creating in-house VIPs could take a lot of engineer’s development time. A fully verified interface should include all the complex protocol compliance checking, generation and application of different test case scenarios, etc.

  • A Generic UVM Scoreboard

    All UVM engineers employ scoreboarding for checking DUT/reference model behavior, but only few spend their time wisely by employing an existing scoreboard architecture. The main reason is that existing frameworks have inadequately served user needs and have failed to improve user effectiveness in the debug situation. This article presents a better UVM scoreboard framework, focusing on scalability, architectural separation and connectivity to foreign environments.

  • Getting ISO 26262 Faults Straight

    Random hardware faults – i.e. individual gates going nuts and driving a value they’re not supposed to – are practically expected in every electronic device, at a very low probability. When we talk about mobile or home entertainment devices, we could live with their impact. But when we talk about safety critical designs, such as automotive or medical, we could well die from it. That explains why ISO 26262 automotive safety standard is obsessed with analyzing and minimizing the risk they pose.

  • Getting ISO 26262 Faults Straight

    ISO 26262 for automotive requires that the impacts of random hardware faults on hardware used in vehicles are thoroughly analyzed and the risk of safety critical failures due to such faults is shown to be below a certain threshold.

  • Low Power Verification Techniques

    This session highlights a "new school" low power methodology termed "successive refinement" that uses the strength of UPF in just such a structured approach.