How Static and Dynamic Failure Analysis Can Improve Productivity in the Assessment of Functional Safety
Integrated circuits used in high-reliability applications must demonstrate low failure rates and high levels of fault detection coverage. Safety Integrity Level (SIL) metrics indicated by the general IEC 61508 standard and the derived Automotive Safety Integrity Level (ASIL) specified by the ISO 26262 standard specify specific failure (FIT) rates and fault coverage metrics (e.g., SPFM and LFM) that must met.
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