Solutions
The Verification Academy offers users multiple entry points to find the information they need. One of these entry points is through Solution collections.
These solutions are industry standards that all design and verification engineers should recognize.
While we continue to add new solutions, users are encouraged to further refine collection information to meet their specific interests.
Methodology
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Unified Coverage
In today's rapidly evolving semiconductor industry, verification teams face unprecedented challenges that traditional approaches can no longer address effectively.
Safety & Security
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Functional Safety
The goal of functional safety is to systematically identify, analyze, and mitigate risks associated with random hardware faults and systematic design errors. This requires a disciplined approach that encompasses detailed failure mode analysis, fault injection campaigns, robustness testing, and the implementation of dedicated safety mechanisms to detect and control faults during operation.
Techniques
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Design for Test Verification
As semiconductor devices become increasingly complex and diverse, spanning automotive, AI/ML, 5G, and heterogeneous 3D-IC designs, Design-for-Test (DFT) verification plays a crucial role in ensuring not only high-test quality but also seamless integration with system-level requirements. While test insertion flows such as scan insertion, BIST/MBIST integration, and boundary scan logic have matured to deliver cost-effective, scalable test solutions, DFT verification remains a bottleneck that demands significant attention.