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by Ajay Daga, CEO, FishTail Design Automation, and Benoit Nadeau-Dostie, Chief Architect, Mentor Graphics
Built-In Self-Test (BIST) is widely used to test embedded memories. This is necessary because of the large number of embedded memories in a circuit which could be in the thousands or even tens of thousands. It is impractical to provide access to all these memories and apply a high quality test. The memory BIST (MBIST) tool reads in user RTL, finds memories and clock sources, generates a test plan that the user can customize if needed, generates MBIST IP, timing constraints, simulation test benches and manufacturing test patterns adapted to end-user circuit.
Multi-cycle paths (MCPs) are used to improve the performance of the circuit
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