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INTRODUCTION
A verification crisis is upon us that will not be solved solely through improvements in verification methodologies and techniques. The solution requires a holistic and philosophical change in the way we approach design with a foundation based on bug prevention. Our proposed first step in implementing this change tightly integrates static analysis into the design process, resulting in a decrease in bug density, which has a positive impact on downstream processes and consequently reduces cost.
THE CRISIS
In 1997, SEMATECH set off an alarm in the industry when it warned that IC manufacturing productivity gains were increasing at a 40% CAGR, while IC design productivity gains increased at only a 20% CAGR. This concern was
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