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Introduction to UVM (27)
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VHDL (26)
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UVM Basics (24)
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Metastability (23)
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Non-Trivial Bug Escapes (22)
Waveform (22)
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PCI Express (21)
Register Model (21)
TLM (21)
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Python (19)
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Big Data (18)
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Covergroup (18)
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Advanced Debug Techniques (17)
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Constrained Random Verification (17)
Design Constructs (17)
Design for Test (17)
Electronic Systems (17)
Fault Injection (17)
Livesim (17)
Object-Oriented Programming in SystemVerilog (17)
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State Space (17)
U2U Europe (17)
Automation (16)
Coverage Points (16)
DFT (16)
Packages (16)
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Signal (16)
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Controllers (15)
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Driver (15)
Inconclusives (15)
Netlist (15)
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Reset-Domain Checking (15)
Testbench Automation (15)
Testplan (15)
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ABV (14)
Automotive Functional Safety Forum (14)
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Config_db (14)
Failure Analysis (14)
Fault Simulation (14)
Gate-Level (14)
March 2016 - Volume 12 Issue 1 (14)
Performance (14)
Report (14)
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Subsystem (14)
UVMC Kit (14)
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Variable (14)
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Assertion-Based Verification (13)
BFMs (13)
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Glitches (13)
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Python for Verification Series (13)
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Sequencer (13)
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X-Propagation (13)
ASIL (12)
Arrays (12)
CDC Analysis (12)
Configuration Database (12)
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HLS (12)
High-Speed (12)
QVIP Configurator (12)
September 2021 - Volume 17 Issue 2 (12)
Unit Testing (12)
Verification IQ (12)
Verification Run Manager (12)
Adoption Trends (11)
Aerospace and Defense Verification Tech Day (11)
C (11)
Creating and Using Constrained Random (11)
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Expressions (11)
Generation (11)
Interview (11)
Jenkins (11)
June 2015 - Volume 11 Issue 2 (11)
June 2017 - Volume 13 Issue 2 (11)
Methods (11)
NVMe (11)
PYUVM (11)
Parameterized Classes (11)
Processor Design Verification (11)
Productivity Gap (11)
RDC Design (11)
Reachability Checks (11)
Register Layer Adapter (11)
Tool Assessment (11)
Verification Process Overview (11)
osmosis 2025 (11)
Continuous Integration System (10)
Coverage Models (10)
Fault Analysis (10)
Fault Grading (10)
Hardware Acceleration (10)
Inheritance (10)
Intelligent Automation (10)
Interrupts (10)
July 2022 - Volume 18 Issue 2 (10)
June 2013 - Volume 9 Issue 2 (10)
Memory Models (10)
OVM (10)
Operators (10)
Proof Coverage (10)
Property Debug (10)
Root of Trust (10)
Safety Metrics (10)
Stimulus Generation (10)
Test Environment (10)
Unified Power Format (10)
VIQ (10)
Analog (9)
Bitstream (9)
Breakpoint (9)
Checkers (9)
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Connections (9)
Creating and Using Functional Coverage (9)
Curriculum (9)
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Data Mining (9)
Data Models (9)
Data Types and Procedural Statements (9)
Deadlock (9)
Declaration (9)
Design Complexity (9)
Formal Assertion-Based Verification (9)
Hierarchical Components (9)
June 2012 - Volume 8 Issue 2 (9)
June 2018 - Volume 14 Issue 2 (9)
Learning Paths (9)
Model Checking (9)
Predictive Analysis (9)
Reset Architecture (9)
Sequence-Driver Use Models (9)
Siemens Xcelerator Academy (9)
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Training (9)
UVM Stimulus, Tests, and Regressions (9)
Verification Closure (9)
Whats New in Functional Verification (9)
1800.2 (8)
AXI (8)
Algorithms (8)
B/C/R Script (8)
Class Reference (8)
Clock Gating (8)
DMA Engine (8)
Design and Verification IP Forum (8)
Directed Test (8)
February 2013 - Volume 9 Issue 1 (8)
HTML Docs (8)
IC Reliability (8)
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Macros (8)
March 2021 - Volume 17 Issue 1 (8)
Matlab (8)
Messaging (8)
Metrics-Driven (8)
Monitor (8)
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Reference Model (8)
Release (8)
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State Transitions (8)
Supply Set (8)
System Level (8)
Timing (8)
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Universal Chiplet Interconnect Express (8)
VHDL-2008 (8)
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3DIC (7)
ADAS (7)
AI Algorithms (7)
CDC Protocol (7)
Chiplets (7)
Class Handles (7)
Class Objects (7)
Clocking Verification Challenges (7)
Connecting the Testbench to the Design (7)
Convergence (7)
DAC 2019 (7)
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Execution Semantics and Synchronization (7)
Gate-Level Simulation (7)
HDL Domain (7)
IP Blocks (7)
IP Security (7)
ISA (7)
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Israel Static & Formal Tech Day (7)
July 2020 - Volume 16 Issue 2 (7)
June 2016 - Volume 12 Issue 2 (7)
LLMs (7)
March 2015 - Volume 11 Issue 1 (7)
March 2022 - Volume 18 Issue 1 (7)
March 2023 - Volume 19 Issue 1 (7)
Metastable (7)
Migration (7)
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Multi-Core Architectures (7)
November 2015 - Volume 11 Issue 3 (7)
Order Property Pattern (7)
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Parameter (7)
Power Analysis (7)
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Traceability (7)
VA Live 2023 - Huntsville (7)
Waivers (7)
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AEH (6)
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Appendix (6)
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Co-Simulation (6)
Conditionals (6)
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DDR (6)
DPI-C (6)
December 2022 - Volume 18 Issue 3 (6)
Design Integrity (6)
Design Mitigation (6)
Distributed Resource Management (6)
Electronic Hardware (6)
Ethernet (6)
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Hierarchical Flow (6)
June 2019 - Volume 15 Issue 2 (6)
MARLUG 2023 (6)
MBIST (6)
MIPI (6)
March 2017 - Volume 13 Issue 1 (6)
March 2020 - Volume 16 Issue 1 (6)
March 2024 - Volume 20 Issue 1 (6)
Multi-die (6)
November 2020 - Volume 16 Issue 3 (6)
October 2013 - Volume 9 Issue 3 (6)
Open Source (6)
Phasing (6)
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Predictors (6)
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Randomization (6)
Reconvergence (6)
SPI (6)
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Schematic (6)
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Secure Data Path (6)
Slave (6)
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TLM FIFOS (6)
UCDB (6)
UCIe (6)
UVM Forum (6)
VA Live 2024 - El Segundo (6)
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VA Live 2025 - Hudson (6)
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Verbosity (6)
Verification Effectiveness (6)
Voltage Domain Crossing (6)
Windows (6)
X-Effects (6)
YAML (6)
osmosis 2024 A&D (6)
ATPG (5)
Advance Your Verification Methodology (5)
Analysis Pattern (5)
BIST (5)
Backdoor Accesses (5)
Command API (5)
Constraint Solver (5)
Coverage Holes (5)
Creating and Using a Test Plan (5)
Cross Coverage (5)
DAC 2018 (5)
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DSP (5)
Data Transfer (5)
December 2019 - Volume 15 Issue 3 (5)
Defect Coverage (5)
Design Scaling (5)
Digital Design (5)
Dual Domains (5)
Error (5)
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FMEDA (5)
Factory Pattern (5)
February 2019 - Volume 15 Issue 1 (5)
Flip-Flop (5)
Fork-Join (5)
Formal Testbench (5)
Functional Correctness (5)
Guidelines (5)
HBM4 (5)
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High-Level Synthesis (5)
In-Circuit Emulation (5)
JEDEC (5)
Layering (5)
Low Power Verification Forum (5)
MARLUG 2024 (5)
March 2018 - Volume 14 Issue 1 (5)
Mixed-Signal Design (5)
Non-Determinism (5)
Overrides (5)
PSL (5)
Postsim (5)
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SVUnit (5)
Simulink (5)
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State Machine (5)
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Stimulus Pattern (5)
Strategy (5)
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Utilization (5)
VA Live 2019 - Westford (5)
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IEEE (4)
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November 2018 - Volume 14 Issue 3 (4)
Objections (4)
PCIe Gen 6 (4)
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Register-Level Scoreboards (4)
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UALink (4)
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VA Live 2023 - Austin (4)
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Verification Complete (4)
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1.2 (3)
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July 2023 - Volume 19 Issue 2 (3)
Jump Statements (3)
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November 2016 - Volume 12 Issue 3 (3)
OSCI (3)
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June 2014 - Volume 10 Issue 2 (2)
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December 2017 - Volume 13 Issue 3 (1)
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