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    The Verification Academy offers users multiple entry points to find the information they need. One of these entry points is through Topic collections. These topics are industry standards that all design and verification engineers should recognize. While we continue to add new topics, users are encourage to further refine collection information to meet their specific interests.

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    The Verification Academy is organized into a collection of free online courses, focusing on various key aspects of advanced functional verification. Each course consists of multiple sessions—allowing the participant to pick and choose specific topics of interest, as well as revisit any specific topics for future reference. After completing a specific course, the participant should be armed with enough knowledge to then understand the necessary steps required for maturing their own organization’s skills and infrastructure on the specific topic of interest. The Verification Academy will provide you with a unique opportunity to develop an understanding of how to mature your organization’s processes so that you can then reap the benefits that advanced functional verification offers.

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    No one argues that the challenges of verification are growing exponentially. What is needed to meet these challenges are tools, methodologies and processes that can help you transform your verification environment. These recorded seminars from Verification Academy trainers and users provide examples for adoption of new technologies and how to evolve your verification process.

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  • Featured Tutorials from DVCon 2018

Featured Tutorials from DVCon 2018

Mentor delivers the most comprehensive Enterprise Verification Platform™ (EVP), delivering performance and productivity improvements ranging from 400X to 10,000X. Tightly integrated combining Questa® for high performance simulation, verification management and coverage closure, low-power, CDC & Formal Verification, Veloce® for hardware emulation and HW/SW system verification, Catapult® for High-Level Synthesis, PowerPro® for RTL Low-Power unified with the Visualizer™ debug environment.

The following papers, posters and tutorials, were featured at DVCon 2018.

Need to become a member?

   DVCON 2017

Featured Tutorials

Comprehensive Metrics-Based Methodology to Achieve Low-Power System-on-Chips

Videos | Slides

Ellie Burns, Gabriel Chidolue and Guillaume Boillet - Mentor, A Siemens Business

In this tutorial, we will step through a complete low-power methodology, and explore the different types of metrics needed at different phases of the design process. It will cover a new and unique low-power coverage methodology that enables designers to verify and track how well they have tested their power management architecture. It will also show how to track not only metrics for how much power is used in the RTL, but also how much power is still being wasted and has potential to be reduced for IP qualification. Finally, it will step through how to bring real power scenarios testing into both your power measurement and management coverage metrics to provide the final phase of power verification and validation.

How to Stay Out of the News with ISO 26262-Compliant Verification

Videos | Slides

Charles Battikha and Doug Smith - Mentor, A Siemens Business

In this tutorial you will learn:

  • What are the basics of the ISO 26262 standard as it applies to requirements for electronic design & verification of safety critical products
  • How to estimate the safety level of a design by defining safety goals, selecting "safety mechanisms", and specifying fault metrics
  • How today's dynamic, static, and hardware-assisted verification flows can be employed to verify the safety-critical RTL designs, gate-level implementations, and embedded bare-metal software and firmware
  • Advanced techniques to eliminate large numbers of irrelevant faults without compromising the completeness of the verification, or the safety of the finished product.

 

Featured Poster Presentations

Cleaning Out Your Pipes – Pipeline Debug in UVM Testbenches

  • Abstract
  • Presentation

Cleaning Out Your Pipes – Pipeline Debug in UVM Testbenches

Authors:
Rich Edelman - Mentor, A Siemens Business & Neil Bulman - Arm Limited

Abstract:
The motivation and example used for this paper was a sub-section of an Arm® Cortex-M33, which was announced October 2016.

  • Characteristics of the Cortex-M4 plus TrustZone security and 3-stage instruction pipeline.
  • Design code
    • 62 files, 100,000 lines of code
  • Testbench code
    • 95 files, 12,000 lines of code
  • A typical test
    • a minute with random seeds.

View Poster | Presentation

Reusable UPF: Transitioning from RTL to Gate Level Verification

  • Abstract
  • Presentation

Reusable UPF: Transitioning from RTL to Gate Level Verification

Authors:
Durgesh Prasad, Jitesh Bansal and Madhur Bhargava - Mentor, A Siemens Business

Abstract:

  • Often UPF needs to be modified at the next verification stage (RTL to GLS)
    • Hierarchy changes
    • Cell placements
    • Cell connections
  • Problems
    • Managing different UPFs
    • Logic Equivalence
  • Highlight differences between RTL and GLS UPF
  • Proposed methodology to write RTL UPF
  • Minimal UPF changes required during gate-level power verification

View Poster | Presentation

Comprehensive IP to SoC CDC Verification Using Hybrid Data Model

  • Abstract
  • Presentation

Comprehensive IP to SoC CDC Verification Using Hybrid Data Model

Authors:
Anwesha Choudhury and Ashish Hari - Mentor, A Siemens Business

Abstract:
Need For IP-Based CDC Verification Flow

  • Typically a SoC comprises of diverse IP blocks that are developed and verified independently
  • During CDC verification of SoC, re-verification of IPs leads to redundancy and increases verification effort
  • Desirable use-model is to verify integration of IPs in SoC without re-analysis of IP internals
  • Existing methodologies attempt to address the requirement but suffers due to accuracy and debug limitations

View Poster | Presentation

A Specification-Driven Methodology for the Design and Verification of Reset Domain Crossing Logic

  • Abstract
  • Presentation

A Specification-Driven Methodology for the Design and Verification of Reset Domain Crossing Logic

Authors:
Priya Viswanathan, Kurt Takara, Chris Kwok, Islam Ahmed - Mentor, A Siemens Business

Abstract:
With the increasing complexity of today's System-on-a-Chip (SoC) designs, reset architectures have also increased in complexity. Traditional reset design and verification techniques have not evolved to address this increase in complexity. In order to avoid ad-hoc reset methods, this paper presents a specification-driven methodology to enable the design and verification of reset domain crossing (RDC) paths in large SoC designs. This methodology is a 3-step process that provides a requirements-based approach for RDC design and verification.

View Poster | Presentation

Improving Verification Predictability and Efficiency Using Big Data

  • Abstract
  • Presentation

Improving Verification Predictability and Efficiency Using Big Data

Author:
Darron May - Mentor, A Siemens Business

Abstract:
Big Data is a term that has been around for many years. The list of applications for Big Data are endless, but the process stays the same: capture, process and analyze. So why shouldn't this technology help improve your verification process efficiency and predict your next chip sign-off? By providing a Big Data infrastructure, with state of the art technologies, within the verification environment, the combination of all verification metrics allows all resources to be used as efficiently as possible and enables process improvements using predictive analysis. This paper covers the technology, the metrics, and the process, and it will explore a number of techniques enabled by such an infrastructure.

View Poster | Presentation

Unraveling the Complexities of Functional Coverage

  • Abstract
  • Presentation

Unraveling the Complexities of Functional Coverage

Authors:
Rohit Jain and Thom Ellis - Mentor, A Siemens Business

Abstract:

  • For covergroup options, the most efficient settings will be:
    • option.per_instance=0
    • type_option.merge_instances=1
  • Get in the habit of always naming your covergroup instances.
  • Explicitly define a list of cross bins whenever possible, rather than relying on a tools auto-expansion features.

View Poster | Presentation

Managing and Automating Hw/Sw Tests from IP to SoC

  • Abstract
  • Presentation

Managing and Automating Hw/Sw Tests from IP to SoC

Author:
Matthew Ballance - Mentor, A Siemens Business

Abstract:
IP behavior often interacts closely with software beneficial to verify Hw/Sw interaction from IP to SoC. Portable Stimulus ensures reusable, consistent test intent and boosts test-creation productivity.

View Poster | Presentation

Preventing Chip-Killing Glitches on CDC Paths with Automated Formal Analysis

  • Abstract
  • Presentation

Preventing Chip-Killing Glitches on CDC Paths with Automated Formal Analysis

Authors:
Sulabh Kumar Khare, Ashish Hari - Mentor, A Siemens Business and Jackie Hsiung, Mediatek Inc.

Abstract:
Glitches are undesired transitions that occur before the signal settles to its intended value.

View Poster | Presentation

Tired of Slow Gate-Level Design Verification?

  • Abstract
  • Presentation

Tired of Slow Gate-Level Design Verification?

Authors:
Rohit Jain and Shobana Sudhakar - Mentor, A Siemens Business

Abstract:

  • Improving throughput of gate-level simulations
  • Performance impact of badly modeled cells

View Poster | Presentation

SoC Verification of Analog IP Integration through Automated Formal

  • Abstract
  • Presentation

SoC Verification of Analog IP Integration through Automated, Formal-Based, Rule-driven Spec Generation

Authors:
Murugesh Palaniswamy and Ravi Kalyanaraman - Synaptics, Inc.
Gargi Sharma and Bharat Baliga-Savel - Mentor, A Siemens Business

Abstract:

The basis of SoC analog IP connectivity verification is determining all the driver(s) of each of the input ports of the DUT (i.e., the analog IP), and the load(s) of each of the output ports of the DUT that are connected to it in a SoC (i.e., the digital blocks).

View Poster | Presentation

UVM-FM: Reusable Extension Layer for UVM to Simplify Functional Modeling

  • Abstract
  • Presentation

UVM-FM: Reusable Extension Layer for UVM to Simplify Functional Modeling

Authors
Ahmed Kamal - Mentor, A Siemens Business

Abstract:

One of the main challenges in SoC verification is time-to-market pressure, for that reason all verification engineers are looking for new approaches to speed up building and developing their test environments. Universal Verification Methodology (UVM) is the de facto method as it combines many common approaches to standardize the test environment architecture. However, the increase in modern systems complexity introduced new obstacles such as modeling layered protocols. This paper introduces a reusable backward compatible extension layer for the UVM package (UVM-FM), and changes the UVM agent architecture to a network-like topology. UVM-FM solves the communication challenges in the layered protocol modeling process and speeds-up the UVM environment creation in a timely manner. In addition to that, the proposed extension for the UVM package gives more debugging capabilities, which is an important key element.

View Paper | Poster | Presentation

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